文章詳情

                                IN CIRCUIT and functional tester

                                • 產品名稱:IN CIRCUIT and functional tester
                                • 產品型號:Compact SL
                                • 產品廠商:seica
                                • 產品文檔:
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                                簡單介紹
                                This configuration offers a completely automated solution via an integrated, SMEMA-compatible conveyor system, allowing completely automatic board handling and easy integration into high volume production lines. Configurable as ICT,

                                IN CIRCUIT and functional tester

                                的詳細介紹

                                This configuration offers a completely automated solution via an integrated, SMEMA-compatible conveyor system,  allowing completely automatic board handling and easy integration into high volume production lines. Configurable as ict, pre-functional, functional and combinational. The compact footprint and the compliance with WCM criteria, enable easy and successful integration both in-line and/or within an automated test  island. Cost reduction and high throughput guaranteed.

                                Compact SL is particularly suitable for:

                                • parametric and in-circuit tests
                                • functional tests
                                • On-board programming
                                • In-line integration
                                • High-volume production
                                • Automated test islands
                                • Operator-free use
                                • Handling costs reduction


                                Features

                                • Up to 1536 analog channels
                                • Up to 128 hybrid channels (digital channel up to 10 MHz)
                                • Reaching Up to 6 user power supply units
                                • 2-JOB paralllel test with standard cabinet
                                • 4-JOB parallel test with double cabinet
                                • OPENFIX for open pin identification on digital components and connectors
                                • Universal on-board programmer (up to 8 in parallel)
                                • Boundary-scan test
                                • Self-test at the module level
                                • Receiver with pneumatic press and upper contrasts
                                • Off-line Programming and Repair Stations
                                • barcode and 2D code reading management; automatic statistic data collection
                                • Automated programming via CAD data import



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